Education, Science, Technology, Innovation and Life
Open Access
Sign In

Theoretical Thinking on the Organization of “Strategic Defects”

Download as PDF

DOI: 10.23977/membt.2019.11001 | Downloads: 13 | Views: 3168

Author(s)

Wang Peng 1

Affiliation(s)

1 School of Economics and Management, Dalian University, No.10, Xuefu Avenue, Economic & Technical Development Zone, Dalian, Liaoning,The People's Republic of China(PRC)

Corresponding Author

Wang Peng

ABSTRACT

The strategic flaw of the organization is an objective structural or functional endogenous embarrassment, which leads to the mismatch or loss of resource elements and capabilities within the organization, which will have a negative impact on organizational goals, functions, culture and organizational life cycle. The strategic flaws of the organization will inevitably lead to destructive stress effects and black hole effects. The formation and development of organizational strategic defects generally go through three stages: formation stage, diffusion stage and maturity stage.

KEYWORDS

Strategic defect, Stress effect, Black hole effect, Resource loss

CITE THIS PAPER

Wang Peng, Theoretical Thinking on the Organization of “Strategic Defects”. Journal of Membrane Technology (2019) 1: 1-3. DOI: http://dx.doi.org/10.23977/membt.2019.11001.

REFERENCES

[1] Franco Cescon.. (2019) Strategic choices and strategic management accounting in large manufacturing firms, Journal of Management and Governance, 2, 20–39
[2] Marc Castellnou (2019) Empowering strategic decision-making for wildfire management: avoiding the fear trap and creating a resilient landscape, Fire Ecology, 2, 162–180.
[3] Evgenii Shumilov. (2004) Critical evaluation of current molecular MRD strategies including NGS for the management of AML patients with multiple mutations. Hematological Oncology, 3, 106–127.

Downloads: 13
Visits: 3168

Sponsors, Associates, and Links


All published work is licensed under a Creative Commons Attribution 4.0 International License.

Copyright © 2016 - 2031 Clausius Scientific Press Inc. All Rights Reserved.